[1]
Nodira Mustafoeva1, Allanazar Tashatov2, Bünyamin Sahin3 2026. STUDY OF THE EFFECT OF Ni⁺ ION IMPLANTATION ON THE NEAR-SURFACE LAYERS OF SILICON USING MODERN ANALYSIS METHODS. International Multidisciplinary Journal for Research & Development. 13, 03 (Mar. 2026), 735–737.